JPH0236152U - - Google Patents
Info
- Publication number
- JPH0236152U JPH0236152U JP11379888U JP11379888U JPH0236152U JP H0236152 U JPH0236152 U JP H0236152U JP 11379888 U JP11379888 U JP 11379888U JP 11379888 U JP11379888 U JP 11379888U JP H0236152 U JPH0236152 U JP H0236152U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- cooling
- transported
- spray chamber
- cooled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000007921 spray Substances 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 4
- 238000001816 cooling Methods 0.000 claims description 4
- 238000009616 inductively coupled plasma Methods 0.000 claims description 3
- 229910052786 argon Inorganic materials 0.000 claims description 2
- 239000000498 cooling water Substances 0.000 claims description 2
- 239000007789 gas Substances 0.000 claims description 2
- 230000017525 heat dissipation Effects 0.000 claims description 2
- 239000006199 nebulizer Substances 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 claims 2
- 239000012491 analyte Substances 0.000 claims 1
- 238000001514 detection method Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
Landscapes
- Electron Tubes For Measurement (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988113798U JPH0731495Y2 (ja) | 1988-08-30 | 1988-08-30 | 高周波誘導結合プラズマ質量分析計 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988113798U JPH0731495Y2 (ja) | 1988-08-30 | 1988-08-30 | 高周波誘導結合プラズマ質量分析計 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0236152U true JPH0236152U (en]) | 1990-03-08 |
| JPH0731495Y2 JPH0731495Y2 (ja) | 1995-07-19 |
Family
ID=31353958
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988113798U Expired - Lifetime JPH0731495Y2 (ja) | 1988-08-30 | 1988-08-30 | 高周波誘導結合プラズマ質量分析計 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0731495Y2 (en]) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS539081A (en) * | 1976-07-12 | 1978-01-27 | Oce Van Der Grinten Nv | Light conditioning device for gas discharge lamp |
| JPS58111248A (ja) * | 1981-12-23 | 1983-07-02 | Hitachi Ltd | 質量分析計の直接試料導入装置 |
| JPS62131359U (en]) * | 1986-02-13 | 1987-08-19 |
-
1988
- 1988-08-30 JP JP1988113798U patent/JPH0731495Y2/ja not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS539081A (en) * | 1976-07-12 | 1978-01-27 | Oce Van Der Grinten Nv | Light conditioning device for gas discharge lamp |
| JPS58111248A (ja) * | 1981-12-23 | 1983-07-02 | Hitachi Ltd | 質量分析計の直接試料導入装置 |
| JPS62131359U (en]) * | 1986-02-13 | 1987-08-19 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0731495Y2 (ja) | 1995-07-19 |
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